| 000 | 00486nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 210420s1999 xx 000 0 und d | ||
| 020 | _a9780127521657 | ||
| 020 | _a978-0-12-752165-7 | ||
| 041 | _aeng | ||
| 245 |
_aIdentification of Defects in Semiconductors _cMichael Stavola |
||
| 260 |
_bElsevier _c1999 |
||
| 440 | _v51 | ||
| 856 | _uhttps://www.sciencedirect.com/science/bookseries/00808784/51/part/PB | ||
| 906 |
_nFull text _oBook Series Volume _p00808784 _rNon-Subscribed _sPart B |
||
| 999 |
_c151898 _d151898 |
||